Unlocking new contrast in a scanning helium microscope.

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Springer Nature
https://doi.org/10.1038/ncomms10189

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Delicate structures (such as biological samples, organic films for polymer electronics and adsorbate layers) suffer degradation under the energetic probes of traditional microscopies. Furthermore, the charged nature of these probes presents difficulties when imaging with electric or magnetic fields, or for insulating materials where the addition of a conductive coating is not desirable. Scanning helium microscopy is able to image such structures completely non-destructively by taking advantage of a neutral helium beam as a chemically, electrically and magnetically inert probe of the sample surface. Here we present scanning helium micrographs demonstrating image contrast arising from a range of mechanisms including, for the first time, chemical contrast observed from a series of metal-semiconductor interfaces. The ability of scanning helium microscopy to distinguish between materials without the risk of damage makes it ideal for investigating a wide range of systems.
This research was supported under the Australian Research Councils Discovery Projects (Project No. DP08831308) funding scheme. Postgraduate research scholarships (M.B., A.F.) from the University of Newcastle gratefully acknowledged. We thank the Newcastle and Cavendish workshops, Donald MacLaren and Kane O’Donnell for technical support, insightful discussions and assistance. This work was performed in part at both the Materials and ACT nodes of the Australian National Fabrication Facility, which is a company established under the National Collaborative Research Infrastructure Strategy to provide nano- and micro-fabrication facilities for Australia’s researchers.
This is the final version of the article. It was first available from NPG via http://dx.doi.org/10.1038/ncomms10189

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